The work describes a differential near-field scanning optical microscopy (DNSOM) mechanism, which represents a valuable tool for imaging with sub-wavelength resolution. In this approach the acquisition is carried out using squared apertures with dimensions comparable with the wavelength. The aperture, mounted on a xy translational stage driven with piezo-actuators, is scanned in the near field of the object of interest, illuminated by a laser source. In the measurements, a THz quantum cascade laser (QCL) laser is employed emitting at 2.9 THz.The resolution is presently limited by the numerical aperture of the light collection system and by the relative aperture-sample distance. Next steps consist in further improvements of the system in order to reach a resolution of ~ 1 mum and in the spectroscopic analysis of biological samples.

THz differential near-field scanning optical microscopy for biological applications

TREDICUCCI, ALESSANDRO;Beltram F.
2009

Abstract

The work describes a differential near-field scanning optical microscopy (DNSOM) mechanism, which represents a valuable tool for imaging with sub-wavelength resolution. In this approach the acquisition is carried out using squared apertures with dimensions comparable with the wavelength. The aperture, mounted on a xy translational stage driven with piezo-actuators, is scanned in the near field of the object of interest, illuminated by a laser source. In the measurements, a THz quantum cascade laser (QCL) laser is employed emitting at 2.9 THz.The resolution is presently limited by the numerical aperture of the light collection system and by the relative aperture-sample distance. Next steps consist in further improvements of the system in order to reach a resolution of ~ 1 mum and in the spectroscopic analysis of biological samples.
2009
2009 Conference on Lasers & Electro-Optics Europe & 11th European Quantum Electronics Conference (CLEO/EQEC)
Munich, Germany
14-19 June 2009
2009 Conference on Lasers & Electro-Optics Europe & 11th European Quantum Electronics Conference (CLEO/EQEC)
IEEE - INST ELECTRICAL ELECTRONICS ENGINEERS
9781424440795
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11384/84504
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