Low field magnetotransport revealing signatures of ballistic transport effects in strained Si/SiGe cavities is investigated. We fabricated strained Si/SiGe cavities by confining a high mobility Si/SiGe two-dimensional electron gas in a bended nanowire geometry defined by electron-beam lithography and reactive ion etching. The main features observed in the low temperature magnetoresistance curves are the presence of a zero-field magnetoresistance peak and of an oscillatory structure at low fields. By adopting a simple geometrical model we explain the oscillatory structure in terms of electron magnetic focusing. A detailed examination of the zero-field peak line shape clearly shows deviations from the predictions of ballistic weak localization theory.

Low field magnetotransport in strained Si/SiGe cavities

PINGUE, Pasqualantonio;BELTRAM, Fabio
2005

Abstract

Low field magnetotransport revealing signatures of ballistic transport effects in strained Si/SiGe cavities is investigated. We fabricated strained Si/SiGe cavities by confining a high mobility Si/SiGe two-dimensional electron gas in a bended nanowire geometry defined by electron-beam lithography and reactive ion etching. The main features observed in the low temperature magnetoresistance curves are the presence of a zero-field magnetoresistance peak and of an oscillatory structure at low fields. By adopting a simple geometrical model we explain the oscillatory structure in terms of electron magnetic focusing. A detailed examination of the zero-field peak line shape clearly shows deviations from the predictions of ballistic weak localization theory.
semiconductors; ELECTRON DOUBLE-LAYERS, PHASE-TRANSITIONS, MAGNETIC-FIELD, ENERGY-SPECTRUM,
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/11384/12939
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